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Proceedings Paper

Surface-enhanced Raman scattering (SERS) study of C60 and C70 in evaporated films by near-infrared FT-Raman spectroscopy
Author(s): Norihisa Katayama; Yoshinori Miyatake; Yukihiro Ozaki; Koichi Kikuchi; Yohji Achiba; Isao Ikemoto; Keiji Iriyama
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Paper Abstract

The 1064 nm excited FT-Raman spectra have been measured for thin evaporated films of C60 and C70 on metal surface. The spectral quality strongly depends upon the metal employed, the Raman scattering intensity changes with the roughness of the metal surface, and the visible excitations did not give any detectable Raman signals. These observations suggest that the spectra were subjected to surface enhanced Raman scattering (SERS) effect.

Paper Details

Date Published: 31 January 1994
PDF: 2 pages
Proc. SPIE 2089, 9th International Conference on Fourier Transform Spectroscopy, (31 January 1994); doi: 10.1117/12.166755
Show Author Affiliations
Norihisa Katayama, Kwansei Gakuin Univ. (Japan)
Yoshinori Miyatake, Kwansei Gakuin Univ. (Japan)
Yukihiro Ozaki, Kwansei Gakuin Univ. (Japan)
Koichi Kikuchi, Tokyo Metropolitan Univ. (Japan)
Yohji Achiba, Tokyo Metropolitan Univ. (Japan)
Isao Ikemoto, Tokyo Metropolitan Univ. (Japan)
Keiji Iriyama, Jikei Univ. School of Medicine (Japan)


Published in SPIE Proceedings Vol. 2089:
9th International Conference on Fourier Transform Spectroscopy
John E. Bertie; Hal Wieser, Editor(s)

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