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Proceedings Paper

Fourier transform waveguide raman spectroscopy of laminate films
Author(s): Carl G. Zimba; John T. Chen; Edwin L. Thomas; John F. Rabolt
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Paper Abstract

The investigation of the chemistry and physics of thin films has had a considerable impact on the fields of optics, microelectronics, coating technology, and imaging. Of the experimental work reported in the literature, films of one or two layers have been investigated. Modeling the waveguide properties of these films is straight forward and easily done. Of further interest are polymer laminates of several layers as well as polymer films with concentration gradients. As part of a larger overall effort to study multilayer film structures, computational models of optical waveguides of as many as 100 layers have been developed. With these models, it is possible to observe the changes in the distribution of the optical field intensity within the waveguide, and thus the resulting Raman intensity, by varying the number of layers, the refractive indices and thicknesses of each layer, and the wavelength. This has led to some interesting insights into the design of planar optical waveguides for spectroscopy.

Paper Details

Date Published: 31 January 1994
PDF: 2 pages
Proc. SPIE 2089, 9th International Conference on Fourier Transform Spectroscopy, (31 January 1994); doi: 10.1117/12.166753
Show Author Affiliations
Carl G. Zimba, Polaroid (United States)
John T. Chen, Massachusetts Institute of Technology (United States)
Edwin L. Thomas, Massachusetts Institute of Technology (United States)
John F. Rabolt, IBM Corp. (United States)

Published in SPIE Proceedings Vol. 2089:
9th International Conference on Fourier Transform Spectroscopy
John E. Bertie; Hal Wieser, Editor(s)

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