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Proceedings Paper

Fourier transform infrared-attenuated total reflection studies of surfactant adsorption at the solid/liquid interface
Author(s): N. Simon Nunn; Jack Yarwood; Paul A. Stevenson; W. David Cooper
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Paper Abstract

Fourier transform infrared-attenuated total reflection (FTIR-ATR) spectroscopy has been employed to study surfactant adsorption in situ at the solid/liquid interface. Specifically, the adsorption of amine and sorbitan ester based surfactants from deuterated toluene onto the native silicon oxide layer on an Si ATR prism has been investigated. Quantitative analysis of the spectra has enabled the Gibbs surface excess concentration to be calculated and hence adsorption isotherms to be constructed for each surfactant. The orientation of the aliphatic chains in the adsorbed layer has been determined using polarized FTIR-ATR spectroscopy.

Paper Details

Date Published: 31 January 1994
PDF: 2 pages
Proc. SPIE 2089, 9th International Conference on Fourier Transform Spectroscopy, (31 January 1994); doi: 10.1117/12.166689
Show Author Affiliations
N. Simon Nunn, Univ. of Durham (United Kingdom)
Jack Yarwood, Univ. of Durham (United Kingdom)
Paul A. Stevenson, Shell Research Ltd. (United Kingdom)
W. David Cooper, Shell Research Ltd. (United Kingdom)

Published in SPIE Proceedings Vol. 2089:
9th International Conference on Fourier Transform Spectroscopy
John E. Bertie; Hal Wieser, Editor(s)

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