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Study of 2-mercapto-benzothiazole degradation/oxidation of electronic componenets by FTIR and FT-Raman
Author(s): Frederick P. Eng; Malika Carter; Charlene D. Shebib; Yoshiko Nakao
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Paper Abstract

In the past, we had electronic devices which used Loctite 680 (an anaerobic adhesive) and Loctite Primer-T returned from the field with a whitish debris contamination. The debris, ranging from a few microns to several hundred microns (agglomerated) in diameter, had caused a serious problem in the field. The white debris turned out to be related to the Primer- T used on the electronic components. In this paper, we show how we used FT-IR and FT- Raman microscopy to identify the contaminant and the source of the contamination and to gain a better understanding on the formation of the contaminant.

Paper Details

Date Published: 31 January 1994
PDF: 2 pages
Proc. SPIE 2089, 9th International Conference on Fourier Transform Spectroscopy, (31 January 1994); doi: 10.1117/12.166636
Show Author Affiliations
Frederick P. Eng, IBM Corp. (United States)
Malika Carter, IBM Corp. (United States)
Charlene D. Shebib, IBM Corp. (United States)
Yoshiko Nakao, IBM-Japan (Japan)

Published in SPIE Proceedings Vol. 2089:
9th International Conference on Fourier Transform Spectroscopy
John E. Bertie; Hal Wieser, Editor(s)

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