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Proceedings Paper

From semiconductors to superconductors - diversity of applications of an FT-spectrometer in materials research
Author(s): Fernando Romero-Borja; A. Hamed; N. Yu; Lowell L. Wood
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Paper Abstract

A series of experiments is presented in which a Bomem DA8 FT spectrometer is used as the main analytic instrument to clarify different effects in materials research. Our applications of the instrument range from absorbance measurements in semiconducting materials to reflectance measurements on superconducting thin films. Effects such as the change in optical absorbance for C60 films are observed and confirmed by transport measurements. The results of ion implantation processes on boron carbide (B4C) can be monitored by spectral measurements and indicate that the mechanical properties of the second hardest material, after diamond, can be adequately modified for easier machining.

Paper Details

Date Published: 31 January 1994
PDF: 2 pages
Proc. SPIE 2089, 9th International Conference on Fourier Transform Spectroscopy, (31 January 1994); doi: 10.1117/12.166631
Show Author Affiliations
Fernando Romero-Borja, Univ. of Houston (United States)
A. Hamed, Univ. of Houston (United States)
N. Yu, Los Alamos National Lab. (United States)
Lowell L. Wood, Univ. of Houston (United States)


Published in SPIE Proceedings Vol. 2089:
9th International Conference on Fourier Transform Spectroscopy
John E. Bertie; Hal Wieser, Editor(s)

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