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Proceedings Paper

Depth profiling with step-scan FTIR photoacoustic spectroscopy
Author(s): John F. McClelland; Roger W. Jones; S. Ochiai
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Paper Abstract

Recent advances in FT-IR spectrometers provide an extended modulation frequency range and phase modulation. Depth dependent information can now be obtained over a wider range by both modulation frequency variation and phase difference analysis.

Paper Details

Date Published: 31 January 1994
PDF: 2 pages
Proc. SPIE 2089, 9th International Conference on Fourier Transform Spectroscopy, (31 January 1994); doi: 10.1117/12.166579
Show Author Affiliations
John F. McClelland, Iowa State Univ. (United States)
Roger W. Jones, Iowa State Univ. (United States)
S. Ochiai, Iowa State Univ. (United States)


Published in SPIE Proceedings Vol. 2089:
9th International Conference on Fourier Transform Spectroscopy
John E. Bertie; Hal Wieser, Editor(s)

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