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Proceedings Paper

Fourier Transform spectrometry at low resolution: how low can you go?
Author(s): Peter R. Griffiths
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Paper Abstract

The advantages of measuring infrared spectra at low resolution are discussed from both a theoretical and practical standpoint. Multicomponent analysis of materials with strongly overlapping bands can be achieved at resolutions at least an order of magnitude greater than the full-width at half height of the narrowest bands in the spectrum of any component. Discriminant analysis of vapor-phase spectra can be performed at a resolution of 50 cm-1 without significant loss of accuracy.

Paper Details

Date Published: 31 January 1994
PDF: 7 pages
Proc. SPIE 2089, 9th International Conference on Fourier Transform Spectroscopy, (31 January 1994); doi: 10.1117/12.166563
Show Author Affiliations
Peter R. Griffiths, Univ. of Idaho (United States)

Published in SPIE Proceedings Vol. 2089:
9th International Conference on Fourier Transform Spectroscopy
John E. Bertie; Hal Wieser, Editor(s)

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