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Proceedings Paper

Comparison of absolute values of diffuse reflection spectral factor obtained by various methods
Author(s): A. V. Novitski; V. K. Vertushkin; A. M. Uljanov
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Paper Abstract

In the USSR there are two absolute methods of measuring the diffuse reflection spectral factors realized in two high-precision ethalon devices. Hence the unity of measurements requires the comparison of the measurement data obtained from these two devices. This work presents the results of comparisons of these two ethalon devices. We also describe the peculiarity of other main methods for absolute measurements of the diffuse reflection spectral factor.

Paper Details

Date Published: 31 December 1993
PDF: 6 pages
Proc. SPIE 2161, CIS Selected Papers: Photometry, (31 December 1993); doi: 10.1117/12.166386
Show Author Affiliations
A. V. Novitski, Institute for Optical and Physical Measurements (Russia)
V. K. Vertushkin, Institute for Optical and Physical Measurements (Russia)
A. M. Uljanov, Institute for Optical and Physical Measurements (Russia)


Published in SPIE Proceedings Vol. 2161:
CIS Selected Papers: Photometry
Leonid S. Ushakov, Editor(s)

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