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Proceedings Paper

Millimeter-wave scanning surface resistance analyzer using a confocal resonator
Author(s): Dawei Zhang; Jon S. Martens; C. F. Shih; Richard S. Withers; Scott A. Sachtjen; L. P. Suppan; Vincent Kotsubo; Chris P. Tigges
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Paper Abstract

Millimeter-wave confocal resonators are used in a new, commercially available instrument to map the surface resistance of large area (2 - 4 inch diameter) superconducting thin films. Q-factors are measured from the reflection coefficient of the cavity formed by a spherical aluminum mirror and a planar conductor sitting at half the radius of curvature of the mirror. The surface resistance of the superconducting film is extracted from the measured Q values. Typical Rs values of 20 - 40 m(Omega) are measured for high-quality 2' high-Tc superconducting thin films at 94 GHz and 77 K.

Paper Details

Date Published: 4 January 1994
PDF: 11 pages
Proc. SPIE 2156, High Tc Microwave Superconductors and Applications, (4 January 1994); doi: 10.1117/12.166156
Show Author Affiliations
Dawei Zhang, Conductus, Inc. (United States)
Jon S. Martens, Conductus, Inc. (United States)
C. F. Shih, Conductus, Inc. (United States)
Richard S. Withers, Conductus, Inc. (United States)
Scott A. Sachtjen, Conductus, Inc. (United States)
L. P. Suppan, Conductus, Inc. (United States)
Vincent Kotsubo, Conductus, Inc. (United States)
Chris P. Tigges, Sandia National Labs. (United States)

Published in SPIE Proceedings Vol. 2156:
High Tc Microwave Superconductors and Applications
Robert B. Hammond; Richard S. Withers, Editor(s)

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