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Proceedings Paper

Dielectric properties of thin-film SrTiO3 grown on LaAlO3 with YBa2Cu3O7-x electrodes
Author(s): Huey-Daw Wu; Frank S. Barnes; David Galt; John C. Price; James A. Beall
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Paper Abstract

We have fabricated and characterized YBCO (YBa2Cu3O7-x) microstrip resonators on LAO (LaAlO3) substrates that include thin film STO (SrTiO3) coplanar capacitors to study the dielectric properties of thin film STO. The low frequency capacitance of the STO/LAO capacitor is measured as a function of temperature and dc bias. We use the observed resonant frequencies to extract the microwave frequency capacitance of the structure and the Qs to determine the microwave losses. A conformal map is developed and used to transform the observed capacitances into dielectric constant values for the thin film STO.

Paper Details

Date Published: 4 January 1994
PDF: 10 pages
Proc. SPIE 2156, High Tc Microwave Superconductors and Applications, (4 January 1994); doi: 10.1117/12.166149
Show Author Affiliations
Huey-Daw Wu, Univ. of Colorado/Boulder (United States)
Frank S. Barnes, Univ. of Colorado/Boulder (United States)
David Galt, Univ. of Colorado/Boulder (United States)
John C. Price, Univ. of Colorado/Boulder (United States)
James A. Beall, National Institute of Standards and Technology (United States)

Published in SPIE Proceedings Vol. 2156:
High Tc Microwave Superconductors and Applications
Robert B. Hammond; Richard S. Withers, Editor(s)

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