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Proceedings Paper

Optical-structural machine analysis of heterogeneous materials as a basis for forming its physical mechanical properties
Author(s): Eduard I. Ulianov; Konstantin M. Ivanov
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Paper Abstract

The microstructural measurements method was realized on the basis of the information-gage complex `the scanning microscope -- the desk-top computer.' The microstructural measurements method is based on analysis of the structure's morphology with the help of the optical-structural machine analysis method and enables us to determine the information entropy of the structure and quantitative estimation of the morphology structures' well regulated degree.

Paper Details

Date Published: 21 January 1994
PDF: 6 pages
Proc. SPIE 2051, International Conference on Optical Information Processing, (21 January 1994); doi: 10.1117/12.165983
Show Author Affiliations
Eduard I. Ulianov, Baltic State Technical Univ. (Russia)
Konstantin M. Ivanov, Baltic State Technical Univ. (Russia)


Published in SPIE Proceedings Vol. 2051:
International Conference on Optical Information Processing
Yuri V. Gulyaev; Dennis R. Pape, Editor(s)

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