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Proceedings Paper

New technique for testing large optical flat
Author(s): Qingyun Wang; Jinbang Chen; Rihong Zhu; Lei Chen; Yiguang Zhang
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Paper Abstract

This paper discusses the development of a new technique (including theory, method, and equipment, etc.) for testing larger optical flat only by means of a smaller interferometer. It is an overlapping subaperture interference testing (OSIT) technique. The author has established a mathematics model for OSIT to retrieve the surface of the full aperture. The theoretical accuracy of the retrieved surface of the full aperture reached (lambda) /200 (p-v). The relationship between the accuracy of the retrieved wavefront of full aperture and errors (such as system error of interferometer or position error of subapertures, etc.) has been investigated. A computer program was established to simulate the real procedure from testing surface data of subaperture to retrieved wavefront of full aperture.

Paper Details

Date Published: 10 December 1993
PDF: 9 pages
Proc. SPIE 2003, Interferometry VI: Techniques and Analysis, (10 December 1993); doi: 10.1117/12.165477
Show Author Affiliations
Qingyun Wang, Nanjing Univ. of Science & Technology (China)
Jinbang Chen, Nanjing Univ. of Science & Technology (China)
Rihong Zhu, Nanjing Univ. of Science & Technology (China)
Lei Chen, Nanjing Univ. of Science & Technology (China)
Yiguang Zhang, Nanjing Univ. of Science & Technology (China)

Published in SPIE Proceedings Vol. 2003:
Interferometry VI: Techniques and Analysis
Osuk Y. Kwon; Gordon M. Brown; Malgorzata Kujawinska, Editor(s)

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