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Proceedings Paper

Open test and measurement systems application in holography and optics
Author(s): Yury V. Demchenko; Mikhael M. Semerenko
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Paper Abstract

The Open Test and Measurement Systems (OTMS) conception and generalized OTMS model are discussed in this paper. The following levels are defined in the model: object, physical, data, application, and manufacturing. VXIbus based OTMS realization and its benefits are discussed concerning applications for integral optics and golography.

Paper Details

Date Published: 10 December 1993
PDF: 5 pages
Proc. SPIE 2108, International Conference on Holography, Correlation Optics, and Recording Materials, (10 December 1993); doi: 10.1117/12.165433
Show Author Affiliations
Yury V. Demchenko, Vinnitsa Polytechnic Institute (Ukraine)
Mikhael M. Semerenko, Vinnitsa Polytechnic Institute (Ukraine)


Published in SPIE Proceedings Vol. 2108:
International Conference on Holography, Correlation Optics, and Recording Materials
Oleg V. Angelsky, Editor(s)

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