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Proceedings Paper

Electro-optic characterization of polymeric materials for integrated optics
Author(s): Emil Aust; Wolfgang Knoll; Werner Hickel; Harald Knobloch; Horst Orendi
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Paper Abstract

This contribution deals with the application of some recently developed evanescent wave- optical techniques for the characterization of polymeric thin films as basic structures for integrated optics. Surface plasmon- and guided optical wave-spectroscopies and -microscopies are used to determine the linear and nonlinear optical properties of (chi) (2)-active thin films prepared either by spin-casting from solution or by the Langmuir-Blodgett-Kuhn technique.

Paper Details

Date Published: 16 December 1993
PDF: 11 pages
Proc. SPIE 2025, Nonlinear Optical Properties of Organic Materials VI, (16 December 1993); doi: 10.1117/12.165263
Show Author Affiliations
Emil Aust, RIKEN--The Institute of Physical and Chemical Research (Japan)
Wolfgang Knoll, RIKEN--The Institute of Physical and Chemical Research (Japan) and Max-Planck-Institut fue (Germany)
Werner Hickel, Hoechst AG (Germany)
Harald Knobloch, RIKEN--The Institute of Physical and Chemical Research (Japan)
Horst Orendi, RIKEN--The Institute of Physical and Chemical Research (Japan)


Published in SPIE Proceedings Vol. 2025:
Nonlinear Optical Properties of Organic Materials VI
Gustaaf R. Moehlmann, Editor(s)

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