Share Email Print
cover

Proceedings Paper

Integrated, dynamic machine vision system with virtual high resolution
Author(s): Peter Seitz; Martin Stalder; Jeffrey M. Raynor; Graham K. Lang; Cor L. Claeys; Ingrid Debusschere; Nico Ricquier; Giuseppe Cilia; C. Cavanna; U. Muessigmann; A. Abele
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

A novel active vision system for CIM production and inspection applications has been developed in the framework of ESPRIT II project No. 5194 (CIVIS). The system consists of a unique, integrated combination of novel components: camera head, data acquisition electronics, a custom digital image processor, control hardware and a commercial framestore, all under the direction of control and processing software on a PC-486 platform. The camera head incorporates a fast zoom lens in combination with a pan/tilt mirror system, allowing region-of-interest acquisition. The special 256 X 256 MOS image sensor offers programmable resolution and random pixel access. The unique combination of optics, optomechanics and versatile image sensor has a high `virtual resolution,' corresponding to more than 1k X 1k pixels but without the overhead of a high pixel transfer rate. The fast computation of the algorithm employed for the fractal inspection of surfaces is realized with an unusual combination of an electrically switchable hologram (for performing all linear operations at the speed of light in the optical domain), a module-based digital processor and the host computer. In this way, active vision for the inspection of concrete tile surfaces has been implemented by acquiring only relevant image data and elegantly processing them in the most appropriate domain.

Paper Details

Date Published: 29 December 1993
PDF: 11 pages
Proc. SPIE 1987, Recording Systems: High-Resolution Cameras and Recording Devices and Laser Scanning and Recording Systems, (29 December 1993); doi: 10.1117/12.165212
Show Author Affiliations
Peter Seitz, Paul Scherrer Institute (Switzerland)
Martin Stalder, Paul Scherrer Institute (Switzerland)
Jeffrey M. Raynor, Paul Scherrer Institute (Switzerland)
Graham K. Lang, Paul Scherrer Institute (Switzerland)
Cor L. Claeys, IMEC (Belgium)
Ingrid Debusschere, IMEC (Belgium)
Nico Ricquier, IMEC (Belgium)
Giuseppe Cilia, OPTEC s.r.l. (Italy)
C. Cavanna, OPTEC s.r.l. (Italy)
U. Muessigmann, Fraunhofer-Institut fuer Produktionstechnik (Germany)
A. Abele, Fraunhofer-Institut fuer Produktionstechnik (Germany)


Published in SPIE Proceedings Vol. 1987:
Recording Systems: High-Resolution Cameras and Recording Devices and Laser Scanning and Recording Systems
Leo Beiser; Reimar K. Lenz, Editor(s)

© SPIE. Terms of Use
Back to Top