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Proceedings Paper

Evaluation of machine vision systems for six-sigma environment
Author(s): Peter Cencik
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Paper Abstract

Machine vision systems are often used in gaging applications. Analysis of the measurement system is important to determine if the measurement process is adequate to measure the part- to-part variability in the manufacturing process and if the system can be implemented as a reject station. The paper provides the principles of measurement system analysis and the principles of Three-Sigma and Six-Sigma quality control. This paper introduces formulas for evaluating the additional yield loss due to rejection of good parts in Three-Sigma and Six- Sigma process design as function of the measurement system resolution. At the end of the paper we will discuss gage resolution requirements for Three-Sigma and Six-Sigma quality control.

Paper Details

Date Published: 17 December 1993
PDF: 9 pages
Proc. SPIE 1989, Computer Vision for Industry, (17 December 1993); doi: 10.1117/12.164890
Show Author Affiliations
Peter Cencik, Adept Technology (United States)


Published in SPIE Proceedings Vol. 1989:
Computer Vision for Industry
Donald W. Braggins, Editor(s)

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