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Proceedings Paper

Study of Fourier descriptors statistical features
Author(s): Ahmed M. Darwish; Emad-Eldin H. Mohamed
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Paper Abstract

In this paper we present a new approach to reduce the computations involved in recognition applications. Fourier descriptors are treated as a occurrence of a complex random variable. Statistical function measures are then used to characterize the behavior of the complex variable. A study of pattern regeneration based on these statistical features was carried out. Some of these statistical measures were found to comprehend most of the object global features. Thus, they could be used for classification and recognition purposes.

Paper Details

Date Published: 17 December 1993
PDF: 10 pages
Proc. SPIE 1989, Computer Vision for Industry, (17 December 1993); doi: 10.1117/12.164861
Show Author Affiliations
Ahmed M. Darwish, Cairo Univ. (Egypt)
Emad-Eldin H. Mohamed, Cairo Univ. (Egypt)

Published in SPIE Proceedings Vol. 1989:
Computer Vision for Industry
Donald W. Braggins, Editor(s)

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