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Proceedings Paper

High-precision beam alignment of electromagnet wigglers
Author(s): Ilan Ben-Zvi; Xu Z. Qiu
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Paper Abstract

The performance of Free-Electron Lasers depends critically on the quality of the alignment of the electron beam to the wiggler's magnetic axis and the deviation of this axis from a straight line. The measurement of the electron beam position requires numerous beam position monitors in the wiggler, where space is at premium. The beam position measurement is used to set beam steerers for an orbit correction in the wiggler. We propose an alternative high precision alignment method in which one or two external Beam Position Monitors (BPM) are used. In this technique, the field in the elector-wiggler is modulated section by section and the beam position movement at the external BPM is detected in synchronism with the modulation. A beam offset at the modulated beam section will produce a modulation of the beam position at the detector that is a function of the beam offset and the absolute value of the modulation current. The wiggler errors produce a modulation that is a function of the modulation current. It will be shown that this method allows the detection and correction of the beam position at each section in the presence of wiggler errors with a good resolution.

Paper Details

Date Published: 29 November 1993
PDF: 12 pages
Proc. SPIE 2013, Electron-Beam Sources of High-Brightness Radiation, (29 November 1993); doi: 10.1117/12.164805
Show Author Affiliations
Ilan Ben-Zvi, Brookhaven National Lab. (United States)
Xu Z. Qiu, Brookhaven National Lab. (United States)


Published in SPIE Proceedings Vol. 2013:
Electron-Beam Sources of High-Brightness Radiation
Henry P. Freund, Editor(s)

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