Share Email Print

Proceedings Paper

Detector for high-energy photon backscatter
Author(s): Michael D. Silver; Joseph W. Erker; Michael Z. Duncan; Thomas J. Hartford; E. Anne Sivers; James F. Hopkinson
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

High energy photon backscatter uses pair production to probe deep beneath surfaces with single side accessibility or to image thick, radiographically opaque objects. At the higher photon energies needed to penetrate thick and/or highly attenuating objects, Compton backscatter becomes strongly forward peaked with relatively little backscatter flux. Furthermore, the downward energy shift of the backscattered photon makes it more susceptible to attenuation on its outbound path. Above 1.022 MeV, pair production is possible; at about 10 MeV, pari production crosses over Compton scatter as the dominant x-ray interaction mechanism. The backscattered photons can be hard x rays from the bremsstrahlung of the electrons and positrons or 0.511 MeV photons from the annihilation of the positron. Monte Carlo computer simulations of such a backscatter system were done to characterize the output signals and to optimize a high energy detector design. This paper touches on the physics of high energy backscatter imaging and describes at some length the detector design for tomographic and radiographic imaging.

Paper Details

Date Published: 16 December 1993
PDF: 11 pages
Proc. SPIE 2009, X-Ray Detector Physics and Applications II, (16 December 1993); doi: 10.1117/12.164736
Show Author Affiliations
Michael D. Silver, Bio-Imaging Research, Inc. (United States)
Joseph W. Erker, Bio-Imaging Research, Inc. (United States)
Michael Z. Duncan, Bio-Imaging Research, Inc. (United States)
Thomas J. Hartford, Bio-Imaging Research, Inc. (United States)
E. Anne Sivers, Bio-Imaging Research, Inc. (United States)
James F. Hopkinson, Bio-Imaging Research, Inc. (United States)

Published in SPIE Proceedings Vol. 2009:
X-Ray Detector Physics and Applications II
Victor J. Orphan, Editor(s)

© SPIE. Terms of Use
Back to Top