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Proceedings Paper

Sub-keV resolution detection with Cd1-xZnxTe detectors
Author(s): Jack F. Butler; Boris A. Apotovsky; A. Niemela; Heikki Sipila
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Paper Abstract

Preliminary investigations were carried out to evaluate the resolution of Cd1-xZnxTe detectors at temperatures achievable with commercially available, low power Peltier refrigerators. Detectors were in the form of cubes, 2 mm on a side. They were tested using a preamplifier with optical feedback. The input FET was cooled along with the detectors. Resolutions of 409 eV and 326 eV were observed at the 5.9 keV line of Fe-55, at temperatures of -10 degree(s)C and -20 degree(s)C, respectively. Results indicate that a straightforward extension of this work will lead to resolutions well below 200 eV.

Paper Details

Date Published: 16 December 1993
PDF: 7 pages
Proc. SPIE 2009, X-Ray Detector Physics and Applications II, (16 December 1993); doi: 10.1117/12.164731
Show Author Affiliations
Jack F. Butler, Aurora Technologies Corp. (United States)
Boris A. Apotovsky, Aurora Technologies Corp. (United States)
A. Niemela, Outokumpu Instruments OY (Finland)
Heikki Sipila, Outokumpu Instruments OY (Finland)


Published in SPIE Proceedings Vol. 2009:
X-Ray Detector Physics and Applications II
Victor J. Orphan, Editor(s)

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