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Proceedings Paper

Thin-film NaI(Tl) scintillators for high-resolution large-area imaging of soft x rays
Author(s): John A. Shepherd; Stanley E. Sobottka; Mark Bennett Williams
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Paper Abstract

We are developing NaI(Tl) phosphors to use on large-area, photon-counting imaging photomultiplier tubes. An x-ray absorption uniformity of 99% is expected over an area of 133 cm2 at a film thickness of 38 +/- 1.5 micrometers . The spatial resolution of the scintillator films, up to 61 micrometers thick, is consistent with a total detector resolution of less than 92 micrometers , given a phototube resolution of 65 micrometers fwhm. The fwhm for 8 keV spots is presented as a function of angle up to 40 degrees off-incidence and a simple model for the broadening of the fwhm due to parallax is presented. Improvements of 20% in the light- collection efficiency were observed for fiber optic disks coated with potassium silicate before vapor-depositing the NaI(Tl). We also present absolute scintillation energy efficiency measurements by comparing our films to the scintillation of single crystal NaI(Tl).

Paper Details

Date Published: 16 December 1993
PDF: 12 pages
Proc. SPIE 2009, X-Ray Detector Physics and Applications II, (16 December 1993); doi: 10.1117/12.164730
Show Author Affiliations
John A. Shepherd, Univ. of Virginia (United States)
Stanley E. Sobottka, Univ. of Virginia (United States)
Mark Bennett Williams, Univ. of Virginia (United States)

Published in SPIE Proceedings Vol. 2009:
X-Ray Detector Physics and Applications II
Victor J. Orphan, Editor(s)

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