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Proceedings Paper

Characterization of polycrystalline phosphors for area x-ray detectors
Author(s): Sol M. Gruner; Sandor L. Barna; Michael E. Wall; Mark W. Tate; Eric F. Eikenberry
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Paper Abstract

Incorporation of polycrystalline phosphor screens into efficient, high precision x-ray detectors requires an understanding of the subtleties of x-ray capture and subsequent light transmission in the screen, as well as an awareness of how phosphors affect detector calibration. We discuss the preparation of such phosphor screens and their characterization with respect to efficiency, stopping power, spatial resolution, decay time, and spectral output.

Paper Details

Date Published: 16 December 1993
PDF: 11 pages
Proc. SPIE 2009, X-Ray Detector Physics and Applications II, (16 December 1993); doi: 10.1117/12.164729
Show Author Affiliations
Sol M. Gruner, Princeton Univ. (United States)
Sandor L. Barna, Princeton Univ. (United States)
Michael E. Wall, Princeton Univ. (United States)
Mark W. Tate, Princeton Univ. (United States)
Eric F. Eikenberry, Robert Wood Johnson Medical School (United States)


Published in SPIE Proceedings Vol. 2009:
X-Ray Detector Physics and Applications II
Victor J. Orphan, Editor(s)

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