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Proceedings Paper

Applications of electronic shearography for the inspection of airskin structures
Author(s): John B. Deaton; Robert S. Rogowski
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Paper Abstract

Electronic shearography has emerged as a promising new technology for non-contacting, full- field optical nondestructive evaluation. In particular, the `common-path' interferometric configuration that is typically used with shearography offers greater immunity to environmental disturbances as compared to traditional electronic speckle pattern interferometry (ESPI) or holographic interferometry. This advantage gives electronic shearography a potential edge for testing applications in industrial environments. This paper presents results of recent experiments towards evaluating the capability of electronic shearography for the inspection of aluminum airskin structures. The defect classifications targeted in this study included disbonds in adhesively bonded skins as well as fatigue cracks emanating from rivet holes. Selection of an effective loading strategy to isolate the defect regions in the fringe patterns was a primary consideration in this study, as with any type of interferometric inspection. Vacuum stressing proved effective locating disbonds while mechanical point loading with vacuum grippers was used to identify fatigue cracks. In each case, the resolution of the shearographic inspection technique was intrinsically dependent on the size of the field of view.

Paper Details

Date Published: 3 December 1993
PDF: 12 pages
Proc. SPIE 2001, Nondestructive Inspection of Aging Aircraft, (3 December 1993); doi: 10.1117/12.163846
Show Author Affiliations
John B. Deaton, Analytical Services & Materials, Inc. (United States)
Robert S. Rogowski, NASA Langley Research Ctr. (United States)

Published in SPIE Proceedings Vol. 2001:
Nondestructive Inspection of Aging Aircraft
Michael T. Valley; Nancy K. Del Grande; Albert S. Kobayashi, Editor(s)

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