Share Email Print
cover

Proceedings Paper

Novel eddy current field modulation of magneto-optic garnet films for real-time imaging of fatigue cracks and hidden corrosion
Author(s): Gerald L. Fitzpatrick; David K. Thome; Richard L. Skaugset; Eric Y.C. Shih; William C.L. Shih
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A new magneto-optic/eddy current imaging technology promises to revolutionize the nondestructive inspection of aging aircraft and also to provide new ways to inspect unlikely materials such as non-metallic composites. As the name implies, the technology is a hybrid of magneto-optic imaging techniques and novel eddy current excitation methods. The result, a device we call a magneto-optic/eddy current imager, or MOI, allows one to inspect such things as aircraft lap joints for both cracks and hidden corrosion in approximately one tenth the time it would take with conventional eddy current inspection equipment. The device produces realistic, real-time images of both cracks and corrosion and has proven to be a reliable in-service tool. The MOI has been approved for the inspection of Boeing, Douglas, and Lockheed commercial aircraft. It is also currently being used by the U.S. Air Force, NASA, and many other organizations.

Paper Details

Date Published: 3 December 1993
PDF: 13 pages
Proc. SPIE 2001, Nondestructive Inspection of Aging Aircraft, (3 December 1993); doi: 10.1117/12.163845
Show Author Affiliations
Gerald L. Fitzpatrick, Physical Research, Inc. (United States)
David K. Thome, Physical Research, Inc. (United States)
Richard L. Skaugset, Physical Research, Inc. (United States)
Eric Y.C. Shih, Physical Research, Inc. (United States)
William C.L. Shih, PRI Instrumentation, Inc. (United States)


Published in SPIE Proceedings Vol. 2001:
Nondestructive Inspection of Aging Aircraft
Michael T. Valley; Nancy K. Del Grande; Albert S. Kobayashi, Editor(s)

© SPIE. Terms of Use
Back to Top