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Proceedings Paper

Superconducting magnetometry: a possible technique for aircraft NDE
Author(s): John P. Wikswo; Yu Pei Ma; Nestor G. Sepulveda; Daniel J. Staton; Shaofen Tan; Ian M. Thomas
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Paper Abstract

Superconducting quantum interference device (SQUID) magnetometers offer promise as multi- mode instruments capable of obtaining high resolution images of extremely low frequency injected currents or eddy currents, and they can be configured to image the magnetic susceptibility of titanium, aluminum, and nonmetallic composites. While high resolution SQUID magnetometers will generally be noisier than conventional SQUIDs, the small coils and reduced coil-to-source spacing more than compensate to provide low-noise, high- resolution images. To explore SQUID NDE, we have developed research facilities that include the high-resolution MicroSQUID magnetometer, a magnetic shield, a scanning stage, and a computer-based control and data acquisition system. Using this instrumentation, we have imaged magnetic fields produced by varied sources. In support of the experimental studies, we have developed analytical and numerical models for the simulation of flaws with several geometries inside thick and thin current-carrying plates and thin-walled tubes, and have demonstrated that two-dimensional magnetic images can be deconvolved into images of current or magnetization by filtering techniques, finite element models, lead field analyses, and maximum entropy methods.

Paper Details

Date Published: 3 December 1993
PDF: 27 pages
Proc. SPIE 2001, Nondestructive Inspection of Aging Aircraft, (3 December 1993); doi: 10.1117/12.163842
Show Author Affiliations
John P. Wikswo, Vanderbilt Univ. (United States)
Yu Pei Ma, Vanderbilt Univ. (United States)
Nestor G. Sepulveda, Vanderbilt Univ. (United States)
Daniel J. Staton, Vanderbilt Univ. (United States)
Shaofen Tan, Vanderbilt Univ. (United States)
Ian M. Thomas, Vanderbilt Univ. (United States)


Published in SPIE Proceedings Vol. 2001:
Nondestructive Inspection of Aging Aircraft
Michael T. Valley; Nancy K. Del Grande; Albert S. Kobayashi, Editor(s)

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