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Proceedings Paper

Cryogenic cooled silicon-based x-ray optical elements: heat load limit
Author(s): Lin Zhang
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Paper Abstract

A silicon block (typical size 100 X 100 X (20 - 50) mm3) cooled by liquid nitrogen has been studied with various incident power densities and spot sizes on the surface. Gaussian power distribution was assumed. Both bottom cooling and side cooling have been considered. The thermal slope error has been minimized by optimizing the cooling conditions (cooling coefficient and bulk temperature of liquid nitrogen) and the thickness of the silicon block. Finite element analysis has been used because the material properties ((alpha) , k) of silicon are highly non linear. The limits of absorbed total power and power density are estimated for both undulator and wiggler beams with various spot sizes and for the requirement in terms of thermal slope error. Correlations between thermal slope error and power, power density have been established.

Paper Details

Date Published: 12 November 1993
PDF: 13 pages
Proc. SPIE 1997, High Heat Flux Engineering II, (12 November 1993); doi: 10.1117/12.163803
Show Author Affiliations
Lin Zhang, European Synchrotron Radiation Facility (France)


Published in SPIE Proceedings Vol. 1997:
High Heat Flux Engineering II
Ali M. Khounsary, Editor(s)

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