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Proceedings Paper

Expert system for noise-ridden interferometric data analysis
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Paper Abstract

Automation of interferogram analysis is very important for successful application of all interferometric measurement techniques. In high-speed aerodynamics or experimental mechanics, complex noise-ridden fringe patterns frequently arise due to prevailing adverse environments. In conventional practice, only local information has been heavily utilized to reduce background noise or to correct phase information. Under these circumstances, the currently available techniques, that is, fringe tracking, phase-shifting, Fourier transform, and regression methods, confront difficulties in phase unwrapping and thus need substantial interactive manual operations. The developed rule-based expert system utilizes both global/regional and local information, and makes use of expert knowledge. It can thus provide a potential for more comprehensive automation in noise reduction and phase unwrapping. The developed expert system adopts a hybrid mechanism in a single package, that is, the low-level and high-level processings to produce an optimal solution in fringe analysis. The system can be coupled with any current interferometric reduction techniques, being based on the analysis of isophase contour lines.

Paper Details

Date Published: 2 December 1993
PDF: 12 pages
Proc. SPIE 2005, Optical Diagnostics in Fluid and Thermal Flow, (2 December 1993); doi: 10.1117/12.163724
Show Author Affiliations
Wonjong Joo, Univ. of Illinois/Chicago (United States)
Soyoung Stephen Cha, Univ. of Illinois/Chicago (United States)

Published in SPIE Proceedings Vol. 2005:
Optical Diagnostics in Fluid and Thermal Flow
Soyoung Stephen Cha; James D. Trolinger, Editor(s)

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