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Proceedings Paper

Diagnosis of plasma in CCD damage process induced by laser
Author(s): Xiao-Wu Ni; Jian Lu; Anzhi He
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Paper Abstract

In this paper, we used shapes of plasmas, which a Q-switched YAG laser acted repeatedly upon a CCD having MOS structure to produce, to investigate the destroying process of the optoelectronic device, and first obtained related experimental results of CCD to be destroyed by a 1.06 micrometers laser beam with a pulse width of 15 ns.

Paper Details

Date Published: 2 December 1993
PDF: 4 pages
Proc. SPIE 2005, Optical Diagnostics in Fluid and Thermal Flow, (2 December 1993); doi: 10.1117/12.163710
Show Author Affiliations
Xiao-Wu Ni, East China Institute of Technology (China)
Jian Lu, East China Institute of Technology (China)
Anzhi He, East China Institute of Technology (China)


Published in SPIE Proceedings Vol. 2005:
Optical Diagnostics in Fluid and Thermal Flow
Soyoung Stephen Cha; James D. Trolinger, Editor(s)

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