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Proceedings Paper

Optical system design of the Voltage ImagingTM optical subsystem (VIOS) in AMLCD in-process test system (IPT)
Author(s): Ying-Moh Liu; David Yushan Fong
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Paper Abstract

Photon Dynamics' IPT system provides high throughput and excellent voltage measurement sensitivity on an AMLCD panel. It is based upon an electro-optical technology to measure the voltage stores on an LCD pixel of an AMLCD active plate. This paper discusses the system performance requirements. From these we derive the optical subsystem requirements. The optical design form and its performance are presented. The current system status, system design issues, and the future improvements also are discussed.

Paper Details

Date Published: 25 November 1993
PDF: 12 pages
Proc. SPIE 2000, Current Developments in Optical Design and Optical Engineering III, (25 November 1993); doi: 10.1117/12.163650
Show Author Affiliations
Ying-Moh Liu, Photon Dynamics, Inc. (United States)
David Yushan Fong, Photon Dynamics, Inc. (United States)


Published in SPIE Proceedings Vol. 2000:
Current Developments in Optical Design and Optical Engineering III
Robert E. Fischer; Warren J. Smith, Editor(s)

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