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Proceedings Paper

Soft x-ray and EUV efficiencies of CCDs
Author(s): Richard C. Catura; Lawrence Shing
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Paper Abstract

We present a compilation of CCD quantum efficiency measurements made at soft x-ray and extreme ultraviolet wavelengths. The measurements include CCDs of varying architecture and have been obtained from a number of projects over the last several years.

Paper Details

Date Published: 19 November 1993
PDF: 5 pages
Proc. SPIE 2006, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IV, (19 November 1993); doi: 10.1117/12.162841
Show Author Affiliations
Richard C. Catura, Lockheed Palo Alto Research Lab. (United States)
Lawrence Shing, Lockheed Palo Alto Research Lab. (United States)


Published in SPIE Proceedings Vol. 2006:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IV
Oswald H. W. Siegmund, Editor(s)

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