Share Email Print
cover

Proceedings Paper

Analysis of rocking curve measurements of LiF flight crystals for the objective crystal spectrometer on SPECTRUM-X-GAMMA
Author(s): Ingolf Halm; Hans-Joachim Wiebicke; U. R.M.E. Geppert; Finn Erland Christensen; Salim Abdali; Herbert W. Schnopper
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The Objective Crystal Spectrometer on the SPECTRUM-X-GAMMA satellite will use three types of natural crystals LiF(220), Si(111), RAP(001), and a multilayer structure providing high-resolution X-ray spectroscopy of Fe, S, O, and C line regions of bright cosmic X-ray sources. 330 - 360 LiF(220) crystals of dimensions approximately 23 X 63 mm2 are required to cover one side of a large (1000 X 600 mm2) panel, which is to be mounted in front of one of two high throughput X-ray telescopes. Rocking curves of 441 LiF(220) crystals measured by using an expanded Cu - K(alpha) 2 beam were analyzed to select the best ones for the flight model. An important parameter is the non-parallelity of the crystal lattice planes with respect to the rear side of the crystals, since it is of the same order of magnitude as the rocking curve width. By lapping the rear side to diminish the non- parallelity and selection the main parameters of the rocking curve averaged over all crystals can be improved at least by a factor of 1.6 both in full width half maximum and peak reflectivity.

Paper Details

Date Published: 19 November 1993
PDF: 11 pages
Proc. SPIE 2006, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IV, (19 November 1993); doi: 10.1117/12.162828
Show Author Affiliations
Ingolf Halm, Max-Planck-Institut fuer Extraterrestrische Physik (Germany)
Hans-Joachim Wiebicke, Max-Planck-Institut fuer Extraterrestrische Physik (Germany)
U. R.M.E. Geppert, Max-Planck-Institut fuer Extraterrestrische Physik (Germany)
Finn Erland Christensen, Danish Space Research Institute (Denmark)
Salim Abdali, Danish Space Research Institute (Netherlands)
Herbert W. Schnopper, Danish Space Research Institute (United States)


Published in SPIE Proceedings Vol. 2006:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IV
Oswald H. W. Siegmund, Editor(s)

© SPIE. Terms of Use
Back to Top