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Proceedings Paper

Preparing samples for scattering measurements--a cleaning study: part 2
Author(s): Jeff L. Brown
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Paper Abstract

Several cleaning methods suitable for cleaning small, low scatter samples in the laboratory are compared. In the present work, these cleaning methods were evaluated for other materials including uncoated fused silica, aluminum oxide and tantalum oxide coated fused silica, molybdenum, and gallium arsenide. The strip cleaners provide outstanding cleaning with drag wiping performing. In addition, results show that the durable surfaces can withstand repeated cleaning cycles. Gallium arsenide is a fragile material which does not stand up well to strip cleaning or solvent swabbing.

Paper Details

Date Published: 1 December 1993
PDF: 12 pages
Proc. SPIE 1995, Optical Scattering: Applications, Measurement, and Theory II, (1 December 1993); doi: 10.1117/12.162666
Show Author Affiliations
Jeff L. Brown, Air Force Wright Lab. (United States)

Published in SPIE Proceedings Vol. 1995:
Optical Scattering: Applications, Measurement, and Theory II
John C. Stover, Editor(s)

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