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Proceedings Paper

New generation high-speed high-resolution hemispherical scatterometer
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Paper Abstract

A new instrument has been developed that takes hundreds of thousands of points of scattered light data at 0.1 degree(s) resolution over a three dimensional segment of the hemisphere. The data can be acquired and displayed in 0.5 to 20 seconds depending on the amount of data desired. The instrument is the size of a 'shoe box' and provides solid state operation. With the instrument's high resolution three dimensional capability, well-defined three dimensional interference patterns, speckle, and diffraction can be seen in near-real-time. Much of these patterns are out of the plane of incidence and sometimes add significantly to the scatter, and may allow a scattering surface to be characterized through methods not available before. The high speed capability makes this instrument ideal for scattered light measurements to be used for high resolution surface defect quality control on high volume assembly lines.

Paper Details

Date Published: 1 December 1993
PDF: 14 pages
Proc. SPIE 1995, Optical Scattering: Applications, Measurement, and Theory II, (1 December 1993); doi: 10.1117/12.162660
Show Author Affiliations
Raymond J. Castonguay, Breault Research Organization, Inc. (United States)


Published in SPIE Proceedings Vol. 1995:
Optical Scattering: Applications, Measurement, and Theory II
John C. Stover, Editor(s)

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