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Proceedings Paper

Mueller matrix measurements of several optical components
Author(s): John C. Stover; Marvin L. Bernt; Tod F. Schiff; Brett D. Swimley
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Paper Abstract

The Stokes/Mueller approach provides complete characterization of sample induced polarization changes to both specular and scattered light that is reflected or transmitted from optical components. Ellipsometry is a subset of this more complete approach to polarization analysis. In this paper, Mueller matrices of several samples are found and compared to the matrix of ideal elements. Samples include optical mirrors that scatter both topographically and non-topographically, waveplates, and optical windows.

Paper Details

Date Published: 1 December 1993
PDF: 6 pages
Proc. SPIE 1995, Optical Scattering: Applications, Measurement, and Theory II, (1 December 1993); doi: 10.1117/12.162655
Show Author Affiliations
John C. Stover, TMA Technologies, Inc. (United States)
Marvin L. Bernt, TMA Technologies, Inc. (United States)
Tod F. Schiff, TMA Technologies, Inc. (United States)
Brett D. Swimley, TMA Technologies, Inc. (United States)


Published in SPIE Proceedings Vol. 1995:
Optical Scattering: Applications, Measurement, and Theory II
John C. Stover, Editor(s)

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