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Proceedings Paper

Very high angular selectivity system for measuring backscatter from rough surfaces
Author(s): Yoshitate Takakura; U. Schon; Patrick Meyrueis
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Paper Abstract

After recalling rough surfaces modelling and theoretical study of light scattering from such surfaces, we present in this paper an experimental set-up to measure backscattered light with a very high angular selectivity. The device is then tested for various samples such as white diffusers, ground metallic surfaces and eventually silver mirrors. When the surface is diffusive, very accurate results can be easily obtained. For surfaces with a specular peak, stray scattering from the surrounding can make the measurement very difficult. However, even in that extreme case, we have been able to investigate into the inverse problem thanks to the angular selectivity and have found quite a reasonable value for the correlation length.

Paper Details

Date Published: 1 December 1993
PDF: 10 pages
Proc. SPIE 1995, Optical Scattering: Applications, Measurement, and Theory II, (1 December 1993); doi: 10.1117/12.162651
Show Author Affiliations
Yoshitate Takakura, Univ. Louis Pasteur (France)
U. Schon, Univ. Louis Pasteur (France)
Patrick Meyrueis, Univ. Louis Pasteur (France)


Published in SPIE Proceedings Vol. 1995:
Optical Scattering: Applications, Measurement, and Theory II
John C. Stover, Editor(s)

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