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Proceedings Paper

Measurement of hemispherical directional reflectance in the infrared
Author(s): John Ternay Neu
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Paper Abstract

This paper presents several types of surface optical property data provided directly and derived from an extended capability directional reflectometer. These data are required in a variety of scientific and industrial fields of research, development and testing including tailored coating development, support of remote sensing, ground truth investigations, thermal analysis, prediction of vehicle signatures, quality control of coatings and surfaces, and studies of geologic and biological sample study. A comparison of the commonly used experimental methods is provided. An explanation and documentation of the reasons for the inadequacy of IR diffuse gold integrating sphere directional reflectometers for most of the extended capability tasks is presented. Examples of data taken with an extended capability directional reflectometer are given. Progress on the development of fully automated, computer controlled hemi-ellipsoidal hemispherical directional reflectometers using a state-of-the-art FT-IR is noted. The sample measurement time from measurement start to printed results for the automated instrument will be less than 10% of the time required for the manual reflectometer.

Paper Details

Date Published: 1 December 1993
PDF: 20 pages
Proc. SPIE 1995, Optical Scattering: Applications, Measurement, and Theory II, (1 December 1993); doi: 10.1117/12.162642
Show Author Affiliations
John Ternay Neu, Surface Optics Corp. (United States)

Published in SPIE Proceedings Vol. 1995:
Optical Scattering: Applications, Measurement, and Theory II
John C. Stover, Editor(s)

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