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Proceedings Paper

Performance of charge-coupled devices in digital shearography
Author(s): Tuck Wah Ng; Fook Siong Chau
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Paper Abstract

The use of charge-coupled devices (CCDs) for imaging in digital shearography necessitates the knowledge of their electronic (signal-independent) noise level, as the visibility of fringes produced is dependent on this factor. A method based on measuring the experimental CCD noise variance to construct a linear equation system is presented. From the solution of this equation system, the electronic noise level of a particular CCD used for imaging can be determined. Evaluation of CCDs based on this noise factor allows the performance of each CCD used in digital shearography to be compared.

Paper Details

Date Published: 22 October 1993
PDF: 6 pages
Proc. SPIE 2066, Industrial Optical Sensing and Metrology: Applications and Integration, (22 October 1993); doi: 10.1117/12.162108
Show Author Affiliations
Tuck Wah Ng, National Univ. of Singapore (Singapore)
Fook Siong Chau, National Univ. of Singapore (Singapore)


Published in SPIE Proceedings Vol. 2066:
Industrial Optical Sensing and Metrology: Applications and Integration
Kevin G. Harding; H. Philip Stahl, Editor(s)

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