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Proceedings Paper

Optical and structural studies of Cu-SiO cermet thin films
Author(s): Mohammad Sayeedur R Khan; E. J. Beynon
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Paper Abstract

Optical absorption measurements have been carried out on Cu-SiO cermet films of the thickness range 200 - 400 nm, prepared by thermal co-evaporation in vacuo approximately 1mPa. The optical band gap Eopt varied between 2.58 and 2.05 eV over the composition range 5 - 15 vol% Cu of the cermet. The addition of Cu to the cermet causes a systematic reduction of Eopt. The values of Ee were found to increase as the copper concentration increased. Electron micrographs indicated a two-phase structure consisting of discrete metallic particles, 1.5 - 3.0 nm in size, in a continuous amorphous phase. The mean particle size increased with increasing Cu content and substrate temperature.

Paper Details

Date Published: 22 October 1993
PDF: 11 pages
Proc. SPIE 2017, Optical Materials Technology for Energy Efficiency and Solar Energy Conversion XII, (22 October 1993); doi: 10.1117/12.161972
Show Author Affiliations
Mohammad Sayeedur R Khan, Brunel Univ. (United Kingdom)
E. J. Beynon, Brunel Univ. (United Kingdom)


Published in SPIE Proceedings Vol. 2017:
Optical Materials Technology for Energy Efficiency and Solar Energy Conversion XII
Carl M. Lampert, Editor(s)

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