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Proceedings Paper

Performance characterization and sensitivity analysis of ATR algorithms to scene distortions
Author(s): Maqsood A. Mohd
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Paper Abstract

In pattern recognition systems the basic task is to match scenes obtained by a sensor at different times. Over the years several algorithms were developed for automatic pattern recognition systems for target acquisition. How good are they? Why do they work? Why do they not work under a different environmental condition? These are questions to which we seek answers. In this paper, a methodology is developed to characterize algorithm performance when subjected to scene geometrical distortions to give insight into the questions posed above. The methodology used is a parameter variation techniques where by perturbations in sensor range and roll angle are made and target probability of detection and location determined. In this investigation actual infrared images are used. The sensitivity analysis methodology developed is illustrated with an example. Application of the generic methodology developed can serve as a very useful tool in testing and evaluating automated pattern recognition systems used in industrial, scientific, commercial, medical, civil defense, and national defense applications.

Paper Details

Date Published: 20 October 1993
PDF: 12 pages
Proc. SPIE 1957, Architecture, Hardware, and Forward-Looking Infrared Issues in Automatic Target Recognition, (20 October 1993); doi: 10.1117/12.161450
Show Author Affiliations
Maqsood A. Mohd, Sverdrup Technology, Inc. (United States)


Published in SPIE Proceedings Vol. 1957:
Architecture, Hardware, and Forward-Looking Infrared Issues in Automatic Target Recognition
Lynn E. Garn; Lynda Ledford Graceffo, Editor(s)

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