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Proceedings Paper

Stability of IAD refractory oxide narrowband interference filters
Author(s): John R. Potter; John C. Simons
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Paper Abstract

The physical and spectral characteristics of refractory oxide narrowband optical filters, fabricated with an ion-assisted deposition process are investigated. The properties of tantalum pentoxide (Ta2O5) and silicon dioxide (SiO2) are compared with more conventional zinc sulfide (ZnS) and cryolite (Na3AlF6) optical interference filters, for effects of radiation, moisture and abrasion, as well as thermal stability. Filter longevity and thermal properties are dramatically improved, which can have a significant impact on the performance of space-borne optical systems.

Paper Details

Date Published: 15 November 1993
PDF: 6 pages
Proc. SPIE 1952, Surveillance Technologies and Imaging Components, (15 November 1993); doi: 10.1117/12.161397
Show Author Affiliations
John R. Potter, Barr Associates, Inc. (United States)
John C. Simons, Barr Associates, Inc. (United States)

Published in SPIE Proceedings Vol. 1952:
Surveillance Technologies and Imaging Components
Sankaran Gowrinathan; C. Bruce Johnson; James F. Shanley, Editor(s)

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