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Proceedings Paper

Image simulation system for flash x-ray diagnosis
Author(s): Kei Takahashi; Eiichi Sato; Teiji Oizumi; Yoshiharu Tamakawa; Toru Yanagisawa
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Paper Abstract

Radiographic image simulations using a spectrum simulation system SPECTRA are presented. SPECTRA calculated the x-ray spectra using the data of tube voltage and current obtained from a soft flash x-ray generator. The x-ray generator used in the present work consisted of a high-voltage power supply, an oil condenser of 10 nF, a turbo molecular pump, a thyristor pulser as a trigger device, and a cold-cathode triode. After the main condenser was charged from 60 to 80 kV, the electric charges in the condenser were discharged. We obtained the maximum tube voltage which was equivalent to the initial charged voltage in the condenser. Bremsstrahlung x-ray intensities were derived from the Kramers' empirical equation and the intensities of the characteristic x rays were approximately calculated on the basis of the experimental results by Birch and Marshall. In the present work, we used two 3-dimensional models provided by SPECTRA as radiographed objects. We saved the measured data of the tube voltage and current for the flash x rays with charged voltages of 60, 70, and 80 kV. Then, assuming that these flash x rays were applied to the above models at a distance of 1 m, we obtained simulated images with filtration of aluminum. The obtained images fairly agreed with real radiographs which were achieved with a Computed Radiography system.

Paper Details

Date Published: 11 October 1993
PDF: 12 pages
Proc. SPIE 2002, Ultrahigh- and High-Speed Photography, Videography, and Photonics '93, (11 October 1993); doi: 10.1117/12.161360
Show Author Affiliations
Kei Takahashi, Iwate Medical Univ. (Japan)
Eiichi Sato, Iwate Medical Univ. (Japan)
Teiji Oizumi, Iwate Medical Univ. (Japan)
Yoshiharu Tamakawa, Iwate Medical Univ. (Japan)
Toru Yanagisawa, Iwate Medical Univ. (Japan)

Published in SPIE Proceedings Vol. 2002:
Ultrahigh- and High-Speed Photography, Videography, and Photonics '93
Paul W. Roehrenbeck, Editor(s)

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