Share Email Print

Proceedings Paper

Gain uniformity, linearity, saturation, and depletion in gated microchannel-plate x-ray framing cameras
Author(s): Otto L. Landen; Perry M. Bell; John A. Oertel; Joseph J. Satariano; David K. Bradley
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The pulsed characteristics of gated, microstrip configuration microchannel-plate (MCP) detectors used in x-ray framing cameras deployed on laser plasma experiments worldwide are examined in greater detail. The detectors are calibrated using short (20 ps) and long (500 ps) pulse x-ray irradiation and 3 - 60 ps, deep UV (202 and 213 nm), spatially-smoothed laser irradiation. Two-dimensional unsaturated gain profiles show < 5% long-range transverse variations but up to 3 dB/cm drop in gain parallel to the pulse propagation direction. Up to 50% gain enhancements due to voltage reflection from the bends of a meander stripline geometry and from the ends of conventional straight striplines are also observed. Reproducible gate profiles are obtained with either picosecond x-ray or UV bursts and FWHM extracted with 3 picosecond accuracy. A novel single-shot method for measuring local gate propagation speeds using a tilted MCP is also demonstrated.

Paper Details

Date Published: 11 October 1993
PDF: 12 pages
Proc. SPIE 2002, Ultrahigh- and High-Speed Photography, Videography, and Photonics '93, (11 October 1993); doi: 10.1117/12.161355
Show Author Affiliations
Otto L. Landen, Lawrence Livermore National Lab. (United States)
Perry M. Bell, Lawrence Livermore National Lab. (United States)
John A. Oertel, Los Alamos National Lab. (United States)
Joseph J. Satariano, Lawrence Livermore National Lab. (United States)
David K. Bradley, Univ. of Rochester (United States)

Published in SPIE Proceedings Vol. 2002:
Ultrahigh- and High-Speed Photography, Videography, and Photonics '93
Paul W. Roehrenbeck, Editor(s)

© SPIE. Terms of Use
Back to Top