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Proceedings Paper

Toward the characterization of infrared cameras
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Paper Abstract

This work focuses on characterizing the performance of various staring PtSi infrared cameras, based on estimating their spatial frequency response. Applying a modified knife edge technique, we arrive at an estimate of the edge spread function (ESF), which is used to obtain a profile through the center of the two-dimensional Modulation Transfer Function (MTF). The MTF of various cameras in the horizontal and vertical direction is measured and compared to the ideal system MTF. The influence of charge transfer efficiency (CTE) on the knife edge measurement and resulting MTF is also modeled and discussed. An estimate of the CTE can actually be obtained from the shape of the ESF in the horizontal direction. The effect of pixel fill factor on the estimated MTF in the horizontal and vertical directions is compared and explained.

Paper Details

Date Published: 1 November 1993
PDF: 10 pages
Proc. SPIE 2020, Infrared Technology XIX, (1 November 1993); doi: 10.1117/12.160567
Show Author Affiliations
Alexis P. Tzannes, Rome Lab. (United States)
Jonathan Martin Mooney, Rome Lab. (United States)


Published in SPIE Proceedings Vol. 2020:
Infrared Technology XIX
Bjorn F. Andresen; Freeman D. Shepherd, Editor(s)

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