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Proceedings Paper

640 x 480 MWIR HgCdTe FPA
Author(s): Lester J. Kozlowski; Robert B. Bailey; Kadri Vural
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Paper Abstract

A high performance 640 X 480 focal plane array has been developed for the 1 - 5 micron band with excellent sensitivity at temperatures below 120 K. The detectors are processed on 2' or 3' diameter PACE-I (producible alternative to CdTe for epitaxy) HgCdTe material. The multiplexer is a direct injection input, switched-FET device with four independent quadrants. The detector is hybridized to the multiplexer through indium columns and is characterized. A mean camera NE(Delta) T (noise equivalent temperature difference) of 13 mK has been achieved for temperatures <EQ 120 K. Background-limited (BLIP) D* of 1 X 1012 Jones (cm-(root)Hz/W) has been measured for 1014 phs/cm2-s background at 95 K. The hybrids have been thermally cycled for 15 times with no interconnect loss. Interconnect yields as high as 99.3% have been achieved.

Paper Details

Date Published: 1 November 1993
PDF: 8 pages
Proc. SPIE 2020, Infrared Technology XIX, (1 November 1993); doi: 10.1117/12.160562
Show Author Affiliations
Lester J. Kozlowski, Rockwell International Science Ctr. (United States)
Robert B. Bailey, Rockwell International Science Ctr. (United States)
Kadri Vural, Rockwell International Science Ctr. (United States)


Published in SPIE Proceedings Vol. 2020:
Infrared Technology XIX
Bjorn F. Andresen; Freeman D. Shepherd, Editor(s)

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