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Proceedings Paper

Enhanced measurement of decentration in multielement lens assemblies
Author(s): Simon Magarill; Brian Welham
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Paper Abstract

This paper describes both an analytical method and an autocollimation microscope for enhanced measuring the position of the center of curvature for a single optical surface in a lens assembly. Because the test is done in a non-destructive manner, it is possible to measure the position of the image of the center of curvature, but not the position of the center of curvature. The developed mathematical model determines the position of the centers of curvature in the lens assembly on the basis of measuring results. It takes into consideration the real position of all surfaces placed between test surface and microscope. When the measurement is complete for all surfaces, the optical axis of the assembly is determined as an average line through all of these measured centers. The decentration and tip of the optical elements can then be controlled with regard to this optical axis. Experiments verify the developed analytical model and software. The accuracy of the measurement is better than 10 microns.

Paper Details

Date Published: 15 October 1993
PDF: 9 pages
Proc. SPIE 1996, Optical Alignment, (15 October 1993); doi: 10.1117/12.160413
Show Author Affiliations
Simon Magarill, U.S. Precision Lens, Inc. (United States)
Brian Welham, U.S. Precision Lens, Inc. (United States)


Published in SPIE Proceedings Vol. 1996:
Optical Alignment
Mitchell C. Ruda, Editor(s)

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