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Proceedings Paper

Reflected magneto-optic spatial light modulator advanced development for miniature ruggedized optical correlators
Author(s): William E. Ross; James P. Karins; Theodore R. Maki; John R. Lucas; Louis G. Kelly; Jaekyong Cho; David N. Lambeth; Tan Le; Keith Mountfield; Suresh Santhanam; Daniel D. Stancil; Mark H. Randles; Jonathan B. Whitlock; Dennis J. Garrity
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Paper Abstract

This paper is a report on the advanced development and characteristics of a new high resolution, high frame rate, reflected R-MOSLM. This effort is aimed at the production of miniature ruggedized optical correlators (MROC) for optical pattern recognition. Pixel size is under one mil center to center, one third the dimension of present transmission mode devices, thereby reducing the optical path length by an order of magnitude. This development includes optimization of the optical and functional characteristics of the MOSLM for Mil Spec Systems. The device research and process development has been performed at Carnegie Mellon University NSF Data Storage System Center under contract from Litton Data Systems. The Litton Electron Device Division is transitioning the device to production. The MROC system description is described in companion paper (1959-09).

Paper Details

Date Published: 25 October 1993
PDF: 8 pages
Proc. SPIE 1959, Optical Pattern Recognition IV, (25 October 1993); doi: 10.1117/12.160291
Show Author Affiliations
William E. Ross, Litton Data Systems (United States)
James P. Karins, Litton Data Systems (United States)
Theodore R. Maki, Litton Data Systems (United States)
John R. Lucas, Litton Data Systems (United States)
Louis G. Kelly, Litton Data Systems (United States)
Jaekyong Cho, Carnegie Mellon Univ. (South Korea)
David N. Lambeth, Carnegie Mellon Univ. (United States)
Tan Le, Carnegie Mellon Univ. (United States)
Keith Mountfield, Carnegie Mellon Univ. (United States)
Suresh Santhanam, Carnegie Mellon Univ. (United States)
Daniel D. Stancil, Carnegie Mellon Univ. (United States)
Mark H. Randles, Litton Airtron (United States)
Jonathan B. Whitlock, Litton Airtron (United States)
Dennis J. Garrity, Litton Airtron (United States)

Published in SPIE Proceedings Vol. 1959:
Optical Pattern Recognition IV
David P. Casasent, Editor(s)

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