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Proceedings Paper

Suitability of various blister tests for thin film adhesion tests
Author(s): Kenneth M. Liechti; A. Shirani
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Paper Abstract

Nonlinear von Karman plate theory is used to analyze circular, island and peninsula blister specimens on a consistent basis in order to examine their suitability as interfacial fracture toughness specimens for thin films on substrates. The peninsula specimen was found to be the most promising.

Paper Details

Date Published: 27 September 1993
PDF: 9 pages
Proc. SPIE 1999, Adhesives Engineering, (27 September 1993); doi: 10.1117/12.158609
Show Author Affiliations
Kenneth M. Liechti, Univ. of Texas/Austin (United States)
A. Shirani, Univ. of Texas/Austin (United States)


Published in SPIE Proceedings Vol. 1999:
Adhesives Engineering
Eric A. Norland; Kenneth M. Liechti, Editor(s)

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