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Proceedings Paper

Test efficiency: a simple parameter for comparing adhesive fracture tests for adhesion measurement
Author(s): Yeh-Hung Lai; David A. Dillard
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Paper Details

Date Published: 27 September 1993
PDF: 10 pages
Proc. SPIE 1999, Adhesives Engineering, (27 September 1993); doi: 10.1117/12.158602
Show Author Affiliations
Yeh-Hung Lai, Virginia Polytechnic Institute and State Univ. (United States)
David A. Dillard, Virginia Polytechnic Institute and State Univ. (United States)


Published in SPIE Proceedings Vol. 1999:
Adhesives Engineering
Eric A. Norland; Kenneth M. Liechti, Editor(s)

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