Share Email Print

Proceedings Paper

New realistic 3D surface microtopography visualization technique
Author(s): Yiping Xu; Chiayu Ai
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We have developed a new realistic 3-D microsurface visualization technique utilizing optical phase-shifting interferometry (PSI). First, we measure the surface topography directly by determining the phase of the wavefront reflected from the surface of the object. The phase information is obtained by shifting the phase of one beam of the interferometer by a known amount and measuring the intensity of the interferometer for many different phase shifts. A phase difference map between the reference and object wavefronts is then calculated from the measured intensities. The vertical resolution is on the order of a few Angstroms. Second, we extend phase-shifting interferometry to a measurement of surface reflectivity. The measured reflectivity is not affected by any variations associated with the light source across the entire illumination field. Third, both the measured surface height data and the reflectivity images are fed into a workstation where advanced computer graphics algorithms are applied. The surface height data are used to generate the 3-D surface profile, which is then shaded by the reflectivity image, resulting in a realistic 3-D image. We will present the theoretical analysis, system setup, experimental measurements, and examples of realistic 3-D microscopic surface images.

Paper Details

Date Published: 23 September 1993
PDF: 8 pages
Proc. SPIE 1915, Stereoscopic Displays and Applications IV, (23 September 1993); doi: 10.1117/12.157039
Show Author Affiliations
Yiping Xu, WYKO Corp. (United States)
Chiayu Ai, WYKO Corp. (United States)

Published in SPIE Proceedings Vol. 1915:
Stereoscopic Displays and Applications IV
John O. Merritt; Scott S. Fisher, Editor(s)

© SPIE. Terms of Use
Back to Top