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Proceedings Paper

Dual magnification video microscope for machine vision
Author(s): John A. Penkethman; Stephen R. Motta
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Paper Abstract

When machine vision utilizing pattern recognition for precise position measurement is used, special emphasis on spatial filtering, stability, and repeatability of the optical image is required. The opposing requirements of a large field of view, which provides for rapid searching, and a high magnification, which provides for higher accuracy, can be mutually exclusive when the image detector is a small CCD array with a finite pixel size. A video microscope for machine vision is described whose key design requirements were appropriate resolution, low cost, a given small space of predetermined shape, two fixed and precise magnifications to be achieved with given object-to-image distances, illumination evenness of 5% or better, and having both dark and bright field illumination.

Paper Details

Date Published: 16 September 1993
PDF: 7 pages
Proc. SPIE 1998, Optomechanical Design, (16 September 1993); doi: 10.1117/12.156622
Show Author Affiliations
John A. Penkethman, Electroglas, Inc. (United States)
Stephen R. Motta, Electroglas, Inc. (United States)

Published in SPIE Proceedings Vol. 1998:
Optomechanical Design
Daniel Vukobratovich; Paul R. Yoder; Victor L. Genberg, Editor(s)

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